A Temperature and Voltage Measurement Cell (TVM Cell) for VLSI circuits
has been developed. It requires less than 1 mm2 of core area (for a 2
micron CMOS technology) and only 4 I/O pins. It can be integrated into any
CMOS VLSI circuit. It permits the measurement of the Circuit Die Temperature
(T) and its Core Power Supply Voltage (V) while the chip is operated
normally in a system.
It achieved simultaneously an accuracy better than 50 mV and 3 Kelvins. Output values are averages of the parameters during a 1 ms period.